AN ELECTRON BEAM IS FOCUSSED ON
THE SAMPLE TO BE ANALYSED. THE ENERGY OF THE ELECTRON BEAM CAUSES
VARIOUS RADIATIONS & PARTICLES TO BE EMITTED FROM THE SAMPLE.
SOME OF THE EMISSIONS ARE CHARACTERISTIC
OF THE ELEMENTS PRESENT IN THE SAMPLE.
CHARACTERISTIC X-RAYS FROM ELEMENTS
IN THE SAMPLE ARE OF PARTICULAR INTEREST
AS THEY ARE MORE EASILY MEASURED.
BOTH ENERGY AND WAVELENGTH ANALYSIS
OF THESE X-RAYS WILL INDICATE WHAT ELEMENTS ARE PRESENT AND THE NUMBER
OF X-RAYS COUNTED INDICATES HOW MUCH OF THE ELEMENT IS PRESENT